FEI / Philips XL30 Environmental Scanning Electron Microscope (ESEM), equipped with an Oxford Instrument INCA-Sight energy dispersive x-ray (EDX) detector. This microscope is fitted with a tungsten (W) filament. Imaging via a range of secondary electron (SE), backscattered electron (BSE) detectors, Large Field Detector (LFD), and Gaseous Secondary Electron detector (GSED). The microscope can operate in high vacuum, low vacuum and full wet (ESEM) mode. The latter offers the potential to examine wet samples in their natural state, and dynamic experiments of water wettability. The microscope is also be equipped with a peltier unit, which enable studies of in-situ chemical reactions between external gases and wet samples at elevated temperatures.

Instrument data:

• Tungsten filament
• Operating voltage: 0.5-30 kV
• Operational vacuum modes: HV, LV and ESEM
  • LV mode: LFD detector, pressure £ 1 torr
  • ESEM mode: GSED detector, pressure £ 7 torr

• Equipped with:
  - Oxford INCA-Sight EDX
  - Peltier stage (0 - 100°C)